English
हिन्दी
Thin Film X-ray Diffractometer
X-ray diffraction (XRD) is a simple non-destructive technique used to obtain detailed information about the crystallographic structure of materials.
MAKE AND MODEL: Bruker D8 ADVANCE
SOURCE: Cu Ka radiation
GEOMETRY: Bragg-Brentano geometry
ATTACHMENTS: Powder and thin films attachments
DETECTOR: High-speed energy-dispersive LYNXEYE XE-T
