X-RAY DIFFRACTOMETER

X-ray Diffraction (XRD) is a high-tech, non-destructive technique ( NDT) for analyzing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin film coatings, ceramics, solar cells and semiconductors.

XRD has become a vital method for materials investigation, characterization and quality control.

Equipment Details

Key Features

Application Areas

Model: D8 Advance

Manufacturer: Bruker

Ultimate X-ray, machine and electrical safety compliance with latest EU directives

D8 goniometer

Equipped with stepper motors with optical encoder to ensure extremely precise angular values.
D8 Goniometer is maintenance free with vertical Theta/2Theta geometry
Equal or better than ±0.01° over the whole angular range

The high-speed energy-dispersive LYNXEYE XE-T detector uniquely combines fast data collection with unprecedented filtering of fluorescence and radiation.
No parasitic low-angle background scattering, massively improves data quality of samples having a large unit cell.
Best peak-to-background enhances sensitivity for minor phases
Full quantification of crystalline and amorphous phases with DIFFRAC.TOPAS

Qualitative and quantitative phase analysis
crystallography, structure analysis
Rietveld analysis

RF AND DC DUAL CHAMBER MAGNETRON SPUTTERING SYSTEM

CHEMICAL VAPOUR INFILTRATION (CVI) REACTOR

X-RAY DIFFRACTOMETER

X-ray Diffractometer

ARCHIVES OF NAL

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