Recovery stress generation in shape memory Ti50Ni45Cu5 thin wires
P. Sittner, D. Vokoun, G.N. Dayananda, R. Stalmans, Materials Science and Engineering A286 (2000) 298-311.
P. Sittner, D. Vokoun, G.N. Dayananda, R. Stalmans, Materials Science and Engineering A286 (2000) 298-311.