A Raman scattering study on the interface structure of nanolayered...
A Raman scattering study on the interface structure of nanolayered TiAIN/TiN and TiN/NbN multilayer thin films grown by reactive DC magnetron sputtering, H. C. Barshilia, K. S. Rajam, Journal of Applied Physics, 98 (2005) 014311, doi: 10.1063/1.1946193